LG Innotek has announced the successful development of the industry's first artificial intelligence technology capable of identifying defective raw materials in chip substrates. By integrating AI-based material data and image processing technologies, the company has implemented this system in its production process to enhance the quality of advanced chip substrates like the flip-chip ball grid array. As chip substrates grow more complex, ensuring materials quality has become essential, with conventional visual inspections proving inadequate in detecting defects. The newly developed AI system can achieve over 90 percent accuracy in assessing materials quality within just one minute, marking a significant advancement in quality control. LG Innotek's Chief Technology Officer, Roh Sung-won, highlighted the system's ability to proactively identify various defect causes in products, paving the way for enhanced customer value. The company aims to further leverage this AI technology in other areas, such as optical solutions like camera modules, to detect defects through image analysis.